Showing 1 - 5 of 5 Results
1.
Semiconductor Characterization : Present Status and Future Needs: Gaithersburg, MD, January ... by Bullis, W. Murray, Seiler, ... ISBN: 9781563965036 List Price: $98.00
2.
Frontiers of Characterization & Metrology for Nanoelectronics 2011 by Seiler, D. G. ISBN: 9780735409651 List Price: $188.00
3.
Optical Characterization in Microelectronics Manufacturing by Perkowitz, S., Duncan, W. M... ISBN: 9780788115394 List Price: $25.00
4.
Narrow Gap Semiconductors and Related Materials by Littler, Chris L., Seiler, ... ISBN: 9780852742105 List Price: $140.00